PubMed
Lee TI et al., Science (New York, N.Y.), 2002 Oct 25;298(5594):799-804Lee TI et al., Science (New York, N.Y.), 2002 Oct 25;298(5594):799-804
Direct
Chip-on-chip
N/A
S288c
Unstressed log-phase growth (control)
YPD medium; mid-log phase
N/A
PubMed
Harbison CT et al., Nature, 2004 Sep 2;431(7004):99-104Harbison CT et al., Nature, 2004 Sep 2;431(7004):99-104
Direct
Chip-on-chip
N/A
S288c
Unstressed log-phase growth (control)
YPD medium; mid-log phase
N/A
PubMed
Hendler A et al., PLoS genetics, 2017 May;13(5):e1006778Hendler A et al., PLoS genetics, 2017 May;13(5):e1006778
Indirect
RNA-seq analysis - WT vs TF Deletion
Negative
15Daub
Unstressed log-phase growth (control)
Yeast strains were grown in rich medium at 30°C to an optical density at 600 nm (OD600) of 0.5.
-0.214613540795579
Indirect
RNA-seq analysis - WT vs TF Deletion
Negative
15Daub
Cell cycle/morphology
Cells were grown in 7 ml of SC over-night at 30°C. Cells were synchronized by alpha factor arrest and release and immediately collected. Transcription factor gene deletion.